A STEM/X‐ray microanalytical study of the equilibrium segregation of bismuth in copper
- 1 September 1981
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 123 (3) , 299-305
- https://doi.org/10.1111/j.1365-2818.1981.tb02474.x
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Microanalysis of Grain Boundary Segregation in Embrittled Iron‐3wt% Nickel Alloys Using STEMJournal of Microscopy, 1978
- The influence of specimen thickness on X-ray count rates in STEM-microanalysisPhilosophical Magazine, 1977
- Anisotropy in grain boundary segregation in copper-bismuth alloysPhilosophical Magazine, 1976
- The quantitative analysis of thin specimensJournal of Microscopy, 1975
- Grain boundary segregationProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1973
- The segregation of bismuth to grain boundaries in copper-bismuth alloysActa Metallurgica, 1973