Sensitivity in Trace Element Analysis of Thick Samples Using Proton Induced X-Rays
- 1 January 1976
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Analytical use of ion-induced X-raysJournal of Physics E: Scientific Instruments, 1975
- Proton induced X-ray emission as a tool for trace element analysisNuclear Instruments and Methods, 1974
- Photon cross sections from 1 keV to 100 MeV for elements Z=1 to Z=100Atomic Data and Nuclear Data Tables, 1970
- Range and stopping-power tables for heavy ionsAtomic Data and Nuclear Data Tables, 1970