A self-consistent technique for the analysis of the temperature dependence of current–voltage and capacitance–voltage characteristics of a tunnel metal-insulator-semiconductor structure
- 15 November 1997
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 82 (10) , 5217-5226
- https://doi.org/10.1063/1.366386
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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