Alpha‐particle‐induced soft errors in high speed bipolar ram
- 1 February 1980
- journal article
- Published by Wiley in Electronics and Communications in Japan (Part I: Communications)
- Vol. 63 (2) , 73-78
- https://doi.org/10.1002/ecja.4400630210
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Alpha-particle tracks in silicon and their effect on dynamic MOS RAM reliabilityIEEE Transactions on Electron Devices, 1979
- Alpha-particle-induced soft errors in dynamic memoriesIEEE Transactions on Electron Devices, 1979
- A New Physical Mechanism for Soft Errors in Dynamic MemoriesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1978
- A static 4096-bit bipolar random-access memoryIEEE Journal of Solid-State Circuits, 1977