Evolution of the dielectric breakdown in Co/Al2O3/Co junctions by annealing
- 1 January 2001
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 89 (1) , 586-589
- https://doi.org/10.1063/1.1329352
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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