High-resolution photoelectron spectrometry of selectedns’ andnd’ autoionization resonances in Ar, Kr, and Xe
- 1 August 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 42 (3) , 1350-1357
- https://doi.org/10.1103/physreva.42.1350
Abstract
Photoionization cross sections (σ) and photoelectron angular distribution parameters (β) across the (ns’,nd’) autoionization resonances for Ar, Kr, and Xe have been measured with photon resolution widths as low as 0.023 Å by means of synchrotron-based photoelectron spectroscopy. The experimental results are compared with those obtained by other experimental techniques and theoretical results. The enhanced resolution allows a redetermination of the width of the ns’ resonances.Keywords
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