Structural characterizations of MOCVD (GaAs)1−x(SiC2H)x films: Evidence for a multiphase structure
- 31 July 1986
- journal article
- Published by Elsevier in Materials Letters
- Vol. 4 (5-7) , 249-255
- https://doi.org/10.1016/0167-577x(86)90017-0
Abstract
No abstract availableKeywords
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