Probing Gunn domains at X-band microwave frequencies using a scanning microscope
- 1 January 1974
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 7 (1) , 69-77
- https://doi.org/10.1088/0022-3727/7/1/315
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- A technique for the linearization of voltage contrast in the scanning electron microscopeJournal of Physics E: Scientific Instruments, 1971
- Stroboscopic Scanning Electron Microscopy at Gigahertz FrequenciesReview of Scientific Instruments, 1971
- A high-contrast directional detector for the scanning electron microscopeJournal of Physics E: Scientific Instruments, 1969
- Time-Resolved Scanning Electron Microscopy and Its Application to Bulk-Effect OscillatorsJournal of Applied Physics, 1969
- Isolation of potential contrast in the scanning electron microscopeJournal of Physics E: Scientific Instruments, 1969
- Stroboscopic scanning electron microscopyJournal of Physics E: Scientific Instruments, 1968
- Secondary Electron Emission from SolidsPublished by Elsevier ,1959