Abstract
Elastic and inelastic electron tunneling have been studied in junctions using thermally oxidized AlOx barriers doped with Si and SiO2. The effective barrier heights are systematically lowered by the addition of Si and SiO2, and for doping above certain levels an electric-field-induced barrier shift is observed for threshold voltages in the range 0.6 to 1.0 V. Inelastic electron tunneling (IET) spectra have been recorded for the pure AlOx+Si and AlOx+SiO2 barriers as well as for such barriers doped with a range of aromatic ring compounds. Strong modes associated with the formation of SiHx bonds are observed and in the case of molecular doping, junctions fabricated with these mixed barriers show changes in the relative intensities of IET-spectroscopy modes when compared to pure AlOx barriers. For very reactive molecules with high π-resonance energy a small amount of Si (≤ 4 Å) evaporated onto the AlOx forms a barrier which allows the observation of higher-energy modes such as C—H stretching modes. These are often quenched due to low-barrier effects in IET-spectroscopy junctions using only pure AlOx barriers. At doping levels of Si and SiO2 corresponding to average evaporated thicknesses greater than ~20 Å, the junctions become extremely non-linear, and for bias voltages above 0.6 V they exhibit characteristics of high-voltage Fowler-Nordheim tunneling and internal field emission. The range of perturbations of the AlOx barrier produced by doping with Si or SiO2 suggests a strong modification of the surface OH groups. This in turn effects the molecular surface reaction and charge transfer associated with molecular doping.