Comparison of defects produced by fast neutrons and 60Co-gammas in high-resistivity silicon detectors using deep-level transient spectroscopy
- 1 April 1997
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 388 (3) , 335-339
- https://doi.org/10.1016/s0168-9002(97)00003-x
Abstract
No abstract availableKeywords
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