Correlation between electrical properties and AES concentration-depth profiles of NiCr thin films
- 1 December 1976
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 39, 219-225
- https://doi.org/10.1016/0040-6090(76)90639-8
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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