An Electro-Thermal Model of Second Breakdown
- 1 January 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 23 (6) , 1679-1684
- https://doi.org/10.1109/tns.1976.4328561
Abstract
A versatile computer program that includes the basic electronic and thermal processes important in second breakdown is described. Calculations of static and dynamic voltage-current characteristics showed that with increasing current density, regions of single-avalanthe, space-charge-limited, double-avalanche, and negative-differential-resistance current flow can be identified. Analytic expressions for the static characteristic in the three positive resistance regions are presented for several diodes at a few temperatures. Second breakdown voltages of more than double the first breakdown voltage have been computed.Keywords
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