A quantitative auger electron spectroscopy method (applied to a thin film monolayer overgrowth)
- 2 October 1983
- journal article
- Published by Elsevier in Surface Science
- Vol. 133 (2-3) , 547-579
- https://doi.org/10.1016/0039-6028(83)90019-5
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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