High-spatial resolution resistivity mapping of large-area YBCO films by a near-field millimeter-wave microscope
- 1 July 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 44 (7) , 1390-1392
- https://doi.org/10.1109/22.508246
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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