Ion range and damage depth parameters for 20–200 keV Pb+ ion implantation in Si
- 1 December 1981
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 191 (1-3) , 124-134
- https://doi.org/10.1016/0029-554x(81)90994-0
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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