Physical design of testable VLSI: techniques and experiments
- 1 January 1989
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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- Layout Influences TestabilityIEEE Transactions on Computers, 1985
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- Fault Modeling and Logic Simulation of CMOS and MOS Integrated CircuitsBell System Technical Journal, 1978