Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysis
- 31 December 1996
- journal article
- Published by Elsevier in Synthetic Metals
- Vol. 83 (3) , 261-265
- https://doi.org/10.1016/s0379-6779(97)80083-5
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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