Energy-filtering transmission electron microscopy in materials science
- 1 January 1992
- journal article
- Published by EDP Sciences in Microscopy Microanalysis Microstructures
- Vol. 3 (2-3) , 141-157
- https://doi.org/10.1051/mmm:0199200302-3014100
Abstract
No abstract availableKeywords
This publication has 46 references indexed in Scilit:
- Contrast in the electron spectroscopic imaging mode of a TEMJournal of Microscopy, 1990
- Contrast in the electron spectroscopic imaging mode of a TEMJournal of Microscopy, 1990
- Electron microscopic channelling imaging of thick specimens with medium-energy electrons in an energy-filter microscopeUltramicroscopy, 1989
- Contrast in the electron spectroscopic imaging mode of a TEM. I. Influence of zero‐loss filtering on scattering contrastJournal of Microscopy, 1989
- Operation modes of electron spectroscopic imaging and electron energy-loss spectroscopy in a transmission electron microscopeUltramicroscopy, 1988
- An energy filter for biological electron microscopyJournal of Microscopy, 1974
- Steigerung der Auflösung bei der elektronen-energieanalysePhysics Letters, 1962
- ber die Beseitigung der inkoh renten Streuung in elektronen-mikroskopischen Abbildungen und Elektronenbeugungsdiagrammen durch ElektronenfilterThe Science of Nature, 1948
- Microanalysis by Means of ElectronsJournal of Applied Physics, 1944
- Characteristic energy losses of electrons scattered from incandescent solidsProceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, 1930