Contrast in the electron spectroscopic imaging mode of a TEM
- 2 August 1990
- journal article
- research article
- Published by Wiley in Journal of Microscopy
- Vol. 159 (2) , 143-160
- https://doi.org/10.1111/j.1365-2818.1990.tb04772.x
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Contrast in the electron spectroscopic imaging mode of a TEMJournal of Microscopy, 1990
- Energy filtered electron microscopy (EFEM) of overbased reverse micellesUltramicroscopy, 1989
- Contrast in the electron spectroscopic imaging mode of a TEM. I. Influence of zero‐loss filtering on scattering contrastJournal of Microscopy, 1989
- Filtered dark-field and pure z-contrast: Two novel imaging modes in a Scanning Transmission Electron MicroscopeUltramicroscopy, 1989
- Coherence of inelastically scattered fast electrons in crystals of finite thicknessPhilosophical Magazine A, 1985
- Thickness dependence of the stem ratio imageUltramicroscopy, 1982
- Calcul de l'influence de la diffusion inélastique des électrons sur les images de monocristauxPhilosophical Magazine, 1977
- Measurement of inelastic/elastic scattering ratio for fast electrons and its use in the study of radiation damagePhysica Status Solidi (a), 1976
- Nonstandard imaging methods in electron microscopyUltramicroscopy, 1976
- Visibility of Single AtomsScience, 1970