X-ray diffraction study of Fe/MgO multilayered films with an enhanced magnetization

Abstract
Fe atoms in Fe(16 AA)/MgO(60 AA) multilayered films, prepared in UHV conditions, have been identified as having the same BCC structure as for the bulk specimens, using X-ray diffraction. The lattice parameter for the Fe atoms was found to be larger than the bulk value by 1.0%. Such a lattice dilation is related to the enhancements in magnetization and hyperfine field of Fe atoms in Fe/MgO multilayered films.