Photoreflectance study of strained (001) Si1−xGex/Si layers
- 1 December 1992
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 222 (1-2) , 85-88
- https://doi.org/10.1016/0040-6090(92)90043-b
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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