Metal-Ceramic Interphase Interfaces: Preparation and Structural Characterization
- 1 January 1988
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Structure, chemistry and diffusion bonding of metal/ceramic interfacesUltramicroscopy, 1987
- The identification of thin amorphous films at grain-boundaries in Al2O3Journal of Materials Science, 1986
- Thin‐Film ReactionsBerichte der Bunsengesellschaft für physikalische Chemie, 1986
- Surface Morphology of Single-Crystal CeramicsMRS Proceedings, 1986
- The Structure of Surface Steps on Low-Index Planes of Oxides.MRS Proceedings, 1985
- Non-epitaxial and graphoepitaxial growth of tin thin films on an UHV-cleaved sodium chloride substrateJournal of Crystal Growth, 1984
- Growth of α‐Al2O3 Within a Transition Alumina MatrixJournal of the American Ceramic Society, 1984
- Directly Bonded Copper Metallization of AℓN Substrates for Power HybridsMRS Proceedings, 1984
- Ion milling of materials science specimens for electron microscopy: A reviewJournal of Electron Microscopy Technique, 1984
- On the reduction of nickel oxideSurface Science, 1982