Selective wet-etching of InGaAs on InAlAs using adipic acid and its application to InAlAs/InGaAs HEMTs
- 1 April 1997
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 12 (4) , 475-480
- https://doi.org/10.1088/0268-1242/12/4/024
Abstract
Highly selective wet-etching of InGaAs on InAlAs was demonstrated using pH-controlled adipic acid, and solutions. A maximum selectivity of 250 was obtained by controlling the InGaAs and InAlAs etching mechanisms. By identifying the rate-determining steps for the etching of InAlAs and InGaAs, we found that the high selectivity is due to the difference in solubility between the oxide of InAlAs and that of InGaAs in the adipic acid solution. InAlAs/InGaAs HEMTs fabricated in a diameter wafer by using this highly selective etching had a threshold voltage and a transconductance with standard deviations of 38 mV and , respectively.Keywords
This publication has 8 references indexed in Scilit:
- Selective reactive ion etching of InGaAs and InP over InAlAs in SiCl4/SiF4/HBr plasmasJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1995
- Thermal stability of AlInAs/GaInAs/InP heterostructuresApplied Physics Letters, 1995
- InAlAs/InGaAs/InP MODFET's with uniform threshold voltage obtained by selective wet gate recessIEEE Electron Device Letters, 1992
- 50-nm self-aligned-gate pseudomorphic AlInAs/GaInAs high electron mobility transistorsIEEE Transactions on Electron Devices, 1992
- Novel, Organic Acid‐Based Etchants for InGaAlAs / InP Heterostructure Devices with AlAs Etch‐Stop LayersJournal of the Electrochemical Society, 1992
- Elimination of mesa-sidewall gate leakage in InAlAs/InGaAs heterostructures by selective sidewall recessingIEEE Electron Device Letters, 1992
- Etch Rates and Selectivities of Citric Acid/Hydrogen Peroxide on GaAs , Al0.3Ga0.7As , In0.2Ga0.8As , In0.53Ga0.47As , In0.52Al0.48As , and InPJournal of the Electrochemical Society, 1992
- Extremely high gain 0.15 μm gate-length InAlAs/InGaAs/InP HEMTsElectronics Letters, 1991