Zur Struktur natürlicher Oxidschichten auf GaAs‐Einkristallen
- 1 January 1975
- journal article
- other
- Published by Wiley in Crystal Research and Technology
- Vol. 10 (4) , K49-K53
- https://doi.org/10.1002/crat.19750100420
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Oxydation von GaAs‐Einkristallscheiben an LuftCrystal Research and Technology, 1975
- ESCA studies of some AIIIBv compounds with Ga and AsPhysica Status Solidi (b), 1973
- Ellipsometrische Bestimmung der Dicke und Brechzahl dünner Schichten auf SiliziumCrystal Research and Technology, 1969
- Ellipsometric investigations of oxide films on Ga AsJournal de Physique, 1964
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962