Effect of injection current density on electroluminescence in silicon quantum dot light-emitting diodes
- 12 October 2009
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 95 (15) , 153103
- https://doi.org/10.1063/1.3248025
Abstract
We report the effect of injection current density on the electroluminescence(EL) from silicon quantum dot(QD)light-emitting diodes. The EL spectra as a function of injection current density were blueshifted and broad. These results are attributed to both the increase in the contribution of small Si QDs in the silicon nitride film due to the increase in the injection current density and the recombination of electron-hole pairs between excited states in the Si QDs due to band bending under high bias.Keywords
This publication has 19 references indexed in Scilit:
- Enhancement of the External Quantum Efficiency of a Silicon Quantum Dot Light‐Emitting Diode by Localized Surface PlasmonsAdvanced Materials, 2008
- Ni ∕ Au contact to silicon quantum dot light-emitting diodes for the enhancement of carrier injection and light extraction efficiencyApplied Physics Letters, 2006
- Oxygen defect and Si nanocrystal dependent white-light and near-infrared electroluminescence of Si-implanted and plasma-enhanced chemical-vapor deposition-grown Si-rich SiO2Journal of Applied Physics, 2005
- Optical properties of silicon nanocrystal LEDsPhysica E: Low-dimensional Systems and Nanostructures, 2003
- Electroluminescence of silicon nanocrystals in MOS structuresApplied Physics A, 2002
- Band gap engineering of amorphous silicon quantum dots for light-emitting diodesApplied Physics Letters, 2001
- Visible light-emitting devices with Schottky contacts on an ultrathin amorphous silicon layer containing silicon nanocrystalsApplied Physics Letters, 1999
- Light emitting diode structure based on Si nanocrystals formed by implantation into thermal oxideJournal of Luminescence, 1998
- Visible electroluminescence from semitransparent Au film/extra thin Si-rich silicon oxide film/p-Si structureJournal of Applied Physics, 1995
- Electroluminescence studies in silicon dioxide films containing tiny silicon islandsJournal of Applied Physics, 1984