A selective microscale x-ray fluorescence analyzing method for determination of trace elements
- 30 November 1973
- journal article
- Published by Elsevier in The International Journal of Applied Radiation and Isotopes
- Vol. 24 (11) , 617-620
- https://doi.org/10.1016/0020-708x(73)90087-2
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Comparison of particle and photon excited X-ray fluorescence applied to trace element measurements of environmental samplesNuclear Instruments and Methods, 1973
- Semiconductor Detector X-Ray Fluorescence Spectrometry Applied to Environmental and Biological AnalysisIEEE Transactions on Nuclear Science, 1972
- High Rate X-Ray Fluorescence Analysis by Pulsed ExcitationIEEE Transactions on Nuclear Science, 1972
- Heavy Element Analysis by Isotope-Excited X-Ray FluoresenceNuclear Technology, 1972