Reversible thermal breakdown as a switching mechanism in chalcogenide glasses
- 1 February 1973
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 20 (2) , 123-131
- https://doi.org/10.1109/t-ed.1973.17618
Abstract
A review of the main features of chalcogenide glass switches is given and interpreted in terms of a thermal runaway mechanism. It is shown that a simple one-dimensional theory is insufficient for describing thin films, and several developments are discussed, including field-dependent effects, channeling instabilities, and electrode hot spots. Suggestions for future work, both theoretical and experimental, that may help to discriminate between thermal and electronic mechanisms are made.Keywords
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