Concurrent test scheduling in built-in self-test environment

This publication has 4 references indexed in Scilit:

• TEST SCHEDULING IN TESTABLE VLSI CIRCUITS
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Graph partitioning for concurrent test scheduling in VLSI circuit
  Published by Association for Computing Machinery (ACM) ,1991
• Test scheduling and control for VLSI built-in self-test
  IEEE Transactions on Computers, 1988
• Test Schedules for VLSI Circuits Having Built-In Test Hardware
  IEEE Transactions on Computers, 1986