A BIST technique for a frequency response and intermodulation distortion test of a sigma-delta ADC
- 17 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Built-in-self-test (BIST) for VLSI systems is desirable for production-time testing and in the field diagnostics. This paper discusses a Mixed Analog Digital BIST (MADBIST) for a frequency response test and an intermodulation distortion test of an Analog-to-Digital converter. The MADBIST strategy for the FR and IMD tests of the ADC is introduced, accuracy issues are discussed, and preliminary experimental results are presented.Keywords
This publication has 5 references indexed in Scilit:
- A BIST scheme for an SNR test of a sigma-delta ADCPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- An analog multi-tone signal generator for built-in-self-test applicationsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A comprehensive approach for modeling and testing analog and mixed-signal devicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Filter banks for time-recursive implementation of transformsIEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 1993
- Full-speed testing of A/D convertersIEEE Journal of Solid-State Circuits, 1984