Manganese concentration and low-temperature annealing dependence ofby x-ray absorption spectroscopy
- 22 May 2002
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 65 (23) , 233201
- https://doi.org/10.1103/physrevb.65.233201
Abstract
The Mn-site-projected electronic structure of the diluted magnetic semiconductors 0.038, 0.047, 0.052, 0.058) of as-grown and low-temperature (LT) annealed samples are systematically studied using high-resolution Mn absorption spectroscopy. The study exhibits coexistence of the ferromagnetic ion and the paramagnetic Mn-As complex that transforms into the ferromagnetic component with LT annealing. The ratio of ferromagnetic to paramagnetic components is directly related to the x dependence of the hole density and ferromagnetic critical temperature.
Keywords
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