Simultaneous Observation of Surface Detail and Cathodoluminescence in the Scanning Electron Microscope
- 1 February 1967
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (2) , 887-888
- https://doi.org/10.1063/1.1709435
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- SCANNING ELECTRON MICROSCOPY OBSERVATIONS OF ZnS PHOSPHOR GRAINS AT HIGH RESOLUTIONApplied Physics Letters, 1966
- The direct observation of electrical leakage paths due to crystal defects by use of the scanning electron microscopeSolid-State Electronics, 1966
- KIKUCHI EFFECTS FROM LOW-ENERGY ELECTRONS IN NICKELApplied Physics Letters, 1966
- Cathodoluminescence at p-n Junctions in GaAsJournal of Applied Physics, 1965
- Evaluation of Passivated Integrated Circuits Using the Scanning Electron MicroscopeJournal of the Electrochemical Society, 1964
- LIII. The Examination of p-n Junctions with the Scanning Electron Microscope†Journal of Electronics and Control, 1957