Störstellenreaktionen bei Cu-dotierten Siliziumkristallen
- 16 June 1986
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 95 (2) , 665-677
- https://doi.org/10.1002/pssa.2210950237
Abstract
No abstract availableKeywords
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- Energy Levels in SiliconAnnual Review of Materials Science, 1980
- Electron Spin Resonance in SemiconductorsPublished by Elsevier ,1962
- Properties of Silicon Doped with Iron or CopperPhysical Review B, 1957