Scaling behavior of sub-micron MOSFETs on fully depleted SOI
- 30 April 1996
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 39 (4) , 445-454
- https://doi.org/10.1016/0038-1101(95)00168-9
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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