Origins of defects in self assembled GaP islands grown on Si(001) and Si(111)
- 15 November 1999
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 357 (1) , 53-56
- https://doi.org/10.1016/s0040-6090(99)00474-5
Abstract
No abstract availableKeywords
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