Accurate de-embedding technique for on-chip small-signal characterization of high-frequency optical modulator

1 March 1996

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters

Vol. 8 (3) , 402-404
https://doi.org/10.1109/68.481131

Abstract

A simple and accurate de-embedding technique has been developed for characterizing the microwave circuit behavior of noninsertable multiple quantum well waveguide modulators with on-chip two-port S-parameter measurements. The small signal equivalent circuit parameters extracted from the error corrected modulation response show an excellent agreement with both one-port microwave reflection coefficient measurement and CV data measured at 1 MHz.

Keywords

This publication has 2 references indexed in Scilit:

Improved error correction technique for on-wafer lightwave measurements of photodetectors
IEEE Photonics Technology Letters, 1995
De-embedding of on-wafer lightwave measurements performed on a monolithic 10 Gb/s InP receiver-oeic
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1993