Post-irradiation behavior of the interface state density and the trapped positive charge
- 1 December 1990
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 37 (6) , 1641-1649
- https://doi.org/10.1109/23.101173
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
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