Characterization of thin oxide films for FET applications
- 15 January 1975
- journal article
- Published by Elsevier in Journal of Solid State Chemistry
- Vol. 12 (3-4) , 232-237
- https://doi.org/10.1016/0022-4596(75)90311-4
Abstract
No abstract availableThis publication has 37 references indexed in Scilit:
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