TRAM: a design methodology for high-performance, easily testable, multimegabit RAMs
- 1 October 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 37 (10) , 1235-1250
- https://doi.org/10.1109/12.5985
Abstract
No abstract availableKeywords
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