Auger recombination in bulk and quantum well InGaAs

Abstract
We report the determination of Auger recombination coefficients in bulk and quantum well InGaAs by time‐resolved luminescence measurements. In bulk InGaAs the coefficient is C=3.2×1028 cm6/s and has the temperature dependence of the valence‐band Auger effect involving the split‐off valence band. In 11 nm quantum well InGaAs we find C=0.9×1028 cm6/s, independent of temperature. The Auger coefficient decreases slightly with decreasing well width.