Scanning Tunneling Microscopy for Morphological Characterization of InN Thin Films
- 1 January 1990
- book chapter
- Published by Springer Nature
- p. 1093-1099
- https://doi.org/10.1007/978-1-4684-5772-8_139
Abstract
No abstract availableKeywords
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- FIELD ION MICROSCOPYPublished by Defense Technical Information Center (DTIC) ,1969