Generation and imaging of domains with the magnetic force microscope
- 31 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 256-261
- https://doi.org/10.1016/0304-3991(92)90276-p
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Probe calibration in magnetic force microscopyApplied Physics Letters, 1990
- Batch fabricated sensors for magnetic force microscopyApplied Physics Letters, 1990
- Magnetic force microscopy of domain wall stray fields on single-crystal iron whiskersApplied Physics Letters, 1990
- Force microscope with capacitive displacement detectionJournal of Vacuum Science & Technology A, 1990
- Magnetic force microscopy of thin Permalloy filmsApplied Physics Letters, 1989
- Investigation of Bloch wall fine structures by magnetic force microscopyJournal of Microscopy, 1988
- Force microscopy of magnetization patterns in longitudinal recording mediaApplied Physics Letters, 1988
- Measurement of in-plane magnetization by force microscopyApplied Physics Letters, 1988
- Application of atomic force microscopy to magnetic materialsJournal of Vacuum Science & Technology A, 1988
- High-resolution magnetic imaging of domains in TbFe by force microscopyApplied Physics Letters, 1988