Hopping Conduction through Localized States in Nb/Al2O3Films

Abstract
Electrical conduction in Nb/Al2 O3 cermet films at low temperatures shows the presence of a new form of hopping conduction through localized states. In this mechanism the dielectric plays an essential role, behaving like an amorphous wide-band-gap semiconductor and acting as host to a distribution of localized states due to Nb dispersed, on an atomic scale, in the alumina matrix.

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