Ab initiocalculation of the stoichiometry and structure of the (0001) surfaces of GaN and AlN
- 15 June 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 57 (24) , 15360-15371
- https://doi.org/10.1103/physrevb.57.15360
Abstract
We have investigated the stoichiometry and the atomic and electronic structure of the anion- and cation-terminated (0001) surfaces of wurtzite-phase GaN and AlN, using ab initio local-orbital calculations based on the local-density approximation and the pseudopotential method. All stable surface configurations studied differ in atomic composition and periodicity from the ideal bulklike termination. We compare the total energy computed for various geometries of GaN and AlN(0001). Vacancy structures are found to be the most stable configurations for the anion- and cation-terminated surfaces. For metal-rich growth conditions, our calculations favor the adsorption of metal atoms on the cation-terminated surface. Anion- and cation-derived dangling-bond states appear in the bulk band gap as a result of the formation of vacancies or the adsorption of group-III atoms. Flat surfaces of both types are found to be stabilized by a ML adsorption of hydrogen.
Keywords
This publication has 53 references indexed in Scilit:
- Growth of AlN and GaN on 6H–SiC(0001) using a helium supersonic beam seeded with ammoniaApplied Physics Letters, 1997
- Monitoring surface stoichiometry with the (2×2) reconstruction during growth of hexagonal-phase GaN by molecular beam epitaxyApplied Physics Letters, 1996
- High-pressure Raman scattering of the stretching mode in nitrogen along the 300-K isothermPhysical Review B, 1996
- Atomic arrangement at the AlN/SiC interfacePhysical Review B, 1996
- High Quality GaN Growth on (0001) Sapphire by Ion-Removed Electron Cyclotron Resonance Molecular Beam Epitaxy and First Observation of (2×2) and (4×4) Reflection High Energy Electron Diffraction PatternsJapanese Journal of Applied Physics, 1996
- InGaN-Based Multi-Quantum-Well-Structure Laser DiodesJapanese Journal of Applied Physics, 1996
- Growth of thin Ni films on GaN(0001)-(1×1)Physical Review B, 1993
- Deposition and surface characterization of high quality single crystal GaN layersJournal of Applied Physics, 1993
- GaN, AlN, and InN: A reviewJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1992
- Highly P-Typed Mg-Doped GaN Films Grown with GaN Buffer LayersJapanese Journal of Applied Physics, 1991