Applications of high‐performance mass spectrometry to the surface analysis of materials
- 1 December 1984
- journal article
- research article
- Published by Wiley in Mass Spectrometry Reviews
- Vol. 3 (4) , 527-585
- https://doi.org/10.1002/mas.1280030404
Abstract
No abstract availableThis publication has 205 references indexed in Scilit:
- An ESD and SIMS study of the composition of platinized, antimony-doped tin oxide films. IApplications of Surface Science, 1983
- Tantalum silicide interconnect characterization by surface analytical techniquesApplications of Surface Science, 1981
- Secondary ion mass spectroscopy studies of glass thin films prepared with sol/gel techniquesApplications of Surface Science, 1981
- SIMS analysis of low temperature ohmic contacts to GaAsApplications of Surface Science, 1981
- Surface analysis of glasses by fast atom bombardment mass spectrometryApplications of Surface Science, 1981
- ESCA and SIMS analysis of the composition of passive films formed on E-brite stainless steelApplications of Surface Science, 1981
- Comparison of static secondary ion mass spectrometry, ion scattering spectroscopy, and x-ray photoelectron spectroscopy for surface analysis of acrylic polymersAnalytical Chemistry, 1981
- Characterization of polymeric thin films by low-damage secondary ion mass spectrometryApplications of Surface Science, 1981
- Combination analysis of oxide films on metals and metal alloys using electron spectroscopy for chemical analysis, Auger electron spectroscopy and secondary ion mass spectrometryThin Solid Films, 1978
- Die Analyse monomolekularer FestkörperoberflÄchenschichten mit Hilfe der SekundÄrionenemissionThe European Physical Journal A, 1970