Calibration for the anodic oxidation of silicon
- 1 February 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 76 (3) , 237-240
- https://doi.org/10.1016/0040-6090(81)90693-3
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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