Analytical Electron Microscopy of Heterogeneous Catalysts

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Abstract
Conventional transmission electron microscopy (CTEM) is by now a quite well-established technique for the study of heterogeneous catalysts. It is commonly used for the determination of metallic particles shapes and size distribution on various types of carriers [1, 2]. In addition, dark field imaging and diffraction measurements (in selected area or microdiffraction mode) allows advantage to be taken of the diffraction of the electrons in order to identify the active phase on the basis of its crystal structure [3, 4].