Lattice parameter and nearest-neighbor distances in Zn1−xFexSe (0≤x≤0.22)
- 15 February 1990
- journal article
- letter
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 67 (4) , 2156-2157
- https://doi.org/10.1063/1.345552
Abstract
Lattice parameters and nearest‐neighbor distances have been measured for bulk grown Zn1−xFexSe (0≤x≤0.22) using standard x‐ray diffraction and extended x‐ray absorption fine structure techniques, respectively. The lattice parameters are in agreement with reported values for molecular beam epitaxy grown films, but differ slightly from published results for other bulk‐grown samples. The nearest‐neighbor distances suggest a slight distortion from the zinc‐blende structure.This publication has 6 references indexed in Scilit:
- Magnetic properties of the diluted magnetic semiconductorSePhysical Review B, 1989
- X-ray characterization of epitaxially grown dilute magnetic semiconductors Zn1 − xFexSe(0 ⩽ x ⩽ 0.22)Thin Solid Films, 1988
- Diluted magnetic semiconductorsJournal of Applied Physics, 1988
- Epitaxial growth and x-ray structural characterization of Zn1−xFexSe films on GaAs(001)Journal of Vacuum Science & Technology A, 1988
- Molecular beam epitaxial growth and characterization of the dilute magnetic semiconductor Zn1−xFexSeApplied Physics Letters, 1987
- Extended x-ray-absorption fine-structure study ofrandom solid solutionsPhysical Review B, 1983