New Phenomenon in the Absorption of Oxygen on Silicon
- 6 February 1978
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 40 (6) , 403-406
- https://doi.org/10.1103/physrevlett.40.403
Abstract
An adsorption state on the Si(111) 2×1 surface has been found which will remove surface states without producing a chemical shift of the Si core level, suggesting a strongly covalent bond. This is accomplished by using an initial exposure pressure of Torr. Exposures using an initial exposure pressure of Torr also remove the surface states but produce a 2.0 eV Si chemical shift indicating an ionic bond different from that of Si (shift of 3.8 eV).
Keywords
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