Design and performance of quadrupole-based SIMS instruments: a critical review
- 1 January 1982
- Vol. 32 (2) , 65-89
- https://doi.org/10.1016/s0042-207x(82)80001-8
Abstract
No abstract availableThis publication has 91 references indexed in Scilit:
- Aspects of quantitative secondary ion mass spectrometryNuclear Instruments and Methods, 1980
- SIMS instrumentation and imaging techniquesScanning, 1980
- Secondary ion mass spectrometry as a means of surface analysisSurface Science, 1979
- The sputtering process and sputtered ion emissionSurface Science, 1979
- Ion probe microanalysisJournal of Physics E: Scientific Instruments, 1975
- Ion microprobe analysers. History and outlookAnalytical Chemistry, 1974
- Secondary ion mass analysis, Technique for three-dimensional characterizationAnalytical Chemistry, 1972
- An investigation of the factors determining maximum resolution in a quadrupole mass spectrometerJournal of Physics E: Scientific Instruments, 1972
- Das elektrische Massenfilter als Massenspektrometer und IsotopentrennerZeitschrift für Physik, 1958
- Notizen: Ein neues Massenspektrometer ohne MagnetfeldZeitschrift für Naturforschung A, 1953