An investigation of active surfaces of microchannel plates using Auger electron and ESCA spectroscopic techniques

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Abstract
The nature of secondary electron emission surfaces of microchannel plates (MCP’s) has been investigated using Auger electron and ESCA spectroscopies. The chemical compositions of a few monolayers of interchannel and intrachannel surfaces have been determined. By making use of ion‐milling techniques along with Auger electron spectroscopy, the composition versus depth profiles of interchannel surfaces have been obtained. It has been found that the compositions of thin layers (∼ 100 Å) of surfaces of MCP’s with self‐emission and higher than normal electrical conductivities are different from those of MCP’s without such defects. The presence of an alikali‐rich surface is found to be more effective in influencing the electrical conductivities of channels than their secondary emission characteristics. Other characteristics of microchannel plates which can be gainfully studied with these techniques have been outlined.

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